RoHS screening using XRF

Non-destructive rapid test in accordance with legal requirements

The RoHS Directive (EU Directive 2011/65/EC or RoHS II for short) requires manufacturers and distributors of electrical and electronic devices to comply with limit values for lead, cadmium, mercury, hexavalent chromium and polybrominated biphenyls/polybrominated diphenyl ethers (Pb, Cd, Hg, Cr-VI, PBBE/PBDE). However, the legislator not only requires proof of RoHS conformity on the design sample, but also demands compliance with the duty of care in production.

In accordance with DIN EN 62321, screening using X-ray fluorescence analysis (XRF) is expressly recommended for this purpose. XRF offers an unrivalled combination of practicality and speed, while at the same time providing a cost-effective individual measurement. Companies can use this method to quickly and easily supplement their often confusing third-party certificates with their own random samples of incoming goods and stock. This results in a significant increase in safety.
The RoHS measurement itself is carried out in seconds and does not require extensive laboratory training. A simple operating philosophy with a traffic light system simplifies the evaluation of the results.

The hand-held XRF analyser from analyticon can be used directly on large components without time-consuming disassembly. For smaller parts, the convenient option of stationary operation in a sample chamber is recommended.
Quality assurance using XRF screening is the method of choice for ensuring RoHS conformity in electronics production.

XRF is also used in test laboratories as an indispensable method for pre-screening. This leads to a considerable increase in the cost-effectiveness of RoHS analyses. The number of time-consuming, expensive, wet-chemical analyses can be significantly reduced and only used where they are really necessary.

Clever solutions

Niton XL2 classic

Fast analysis of high-value elements


Niton XL3 SDD

Fast elemental analysis of Mg – U


Niton XL5

Mobile PMI analysis with lowest detection limits


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